TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm

Pablo Ilha Vaz, Gilson I. Wirth, Fábio Fedrizzi Vidor, Thiago Hanna Both. TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm. Microelectronics Journal, 97:104722, 2020. [doi]

Abstract

Abstract is missing.