Julio César Vázquez, Víctor H. Champac, Chuck Hawkins, Jaume Segura. Stuck-Open Fault Leakage and Testing in Nanometer Technologies. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 315-320, IEEE Computer Society, 2009. [doi]
Abstract is missing.