Program Slicing for Hierarchical Test Generation

Vivekananda M. Vedula, Jacob A. Abraham, Jayanta Bhadra. Program Slicing for Hierarchical Test Generation. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 237-246, IEEE Computer Society, 2002. [doi]

Abstract

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