On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops

Benoît R. Veillette, Gordon W. Roberts. On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 776-785, IEEE Computer Society, 1997.

Authors

Benoît R. Veillette

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Gordon W. Roberts

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