Statistical aging under dynamic voltage scaling: A logarithmic model approach - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jyothi Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao. Statistical aging under dynamic voltage scaling: A logarithmic model approach. In Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012. pages 1-4, IEEE, 2012. [doi]

This author has not been identified. Look up 'Jyothi Velamala' in GoogleThis author has not been identified. Look up 'Ketul Sutaria' in GoogleThis author has not been identified. Look up 'Hirofumi Shimizu' in GoogleThis author has not been identified. Look up 'Hiromitsu Awano' in GoogleThis author has not been identified. Look up 'Takashi Sato' in GoogleThis author has not been identified. Look up 'Yu Cao' in Google

runs on WebDSL