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A. Venkatachar, S. Rajakumar, M. Chapman, S. Basuru, G. Parthasarathy, C. C. Lin, A. Hegde, T. Li. Test Knowledge Data Base. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]

Authors

A. Venkatachar

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S. Rajakumar

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M. Chapman

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S. Basuru

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G. Parthasarathy

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C. C. Lin

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A. Hegde

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T. Li

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