A. Venkatachar, S. Rajakumar, M. Chapman, S. Basuru, G. Parthasarathy, C. C. Lin, A. Hegde, T. Li. Test Knowledge Data Base. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.