A. Venkatachar, S. Rajakumar, M. Chapman, S. Basuru, G. Parthasarathy, C. C. Lin, A. Hegde, T. Li. Test Knowledge Data Base. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{VenkatacharRCBP17,
title = {Test Knowledge Data Base},
author = {A. Venkatachar and S. Rajakumar and M. Chapman and S. Basuru and G. Parthasarathy and C. C. Lin and A. Hegde and T. Li},
year = {2017},
doi = {10.1109/VLSI-DAT.2017.7939654},
url = {https://doi.org/10.1109/VLSI-DAT.2017.7939654},
researchr = {https://researchr.org/publication/VenkatacharRCBP17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017},
publisher = {IEEE},
isbn = {978-1-5090-3969-2},
}