ATE test time reduction using asynchronous clock period

Praveen Venkataramani, Vishwani D. Agrawal. ATE test time reduction using asynchronous clock period. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-10, IEEE Computer Society, 2013. [doi]

Authors

Praveen Venkataramani

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Vishwani D. Agrawal

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