Praveen Venkataramani, Vishwani D. Agrawal. ATE test time reduction using asynchronous clock period. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-10, IEEE Computer Society, 2013. [doi]
@inproceedings{VenkataramaniA13-0,
title = {ATE test time reduction using asynchronous clock period},
author = {Praveen Venkataramani and Vishwani D. Agrawal},
year = {2013},
doi = {10.1109/TEST.2013.6651931},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2013.6651931},
researchr = {https://researchr.org/publication/VenkataramaniA13-0},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013},
publisher = {IEEE Computer Society},
}