Design of high-yield defect-tolerant self-assembled nanoscale memories - researchr publication authors

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Girish Venkatasubramanian, P. Oscar Boykin, Renato J. O. Figueiredo. Design of high-yield defect-tolerant self-assembled nanoscale memories. In 2007 IEEE International Symposium on Nanoscale Architectures, NANOARCH 2007, San Jose, CA, USA, October 21-22, 2007. pages 77-84, IEEE Computer Society, 2007. [doi]

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