Girish Venkatasubramanian, P. Oscar Boykin, Renato J. O. Figueiredo. Design of high-yield defect-tolerant self-assembled nanoscale memories. In 2007 IEEE International Symposium on Nanoscale Architectures, NANOARCH 2007, San Jose, CA, USA, October 21-22, 2007. pages 77-84, IEEE Computer Society, 2007. [doi]
@inproceedings{Venkatasubramanian07-0,
title = {Design of high-yield defect-tolerant self-assembled nanoscale memories},
author = {Girish Venkatasubramanian and P. Oscar Boykin and Renato J. O. Figueiredo},
year = {2007},
url = {http://dl.acm.org/citation.cfm?id=1548938},
researchr = {https://researchr.org/publication/Venkatasubramanian07-0},
cites = {0},
citedby = {0},
pages = {77-84},
booktitle = {2007 IEEE International Symposium on Nanoscale Architectures, NANOARCH 2007, San Jose, CA, USA, October 21-22, 2007},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-1791-9},
}