R. Venkatraman, R. Castagnetti, S. Ramesh. The Statistics of Device Variations and its Impact on SRAM Bitcell Performance, Leakage and Stability. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 190-195, IEEE Computer Society, 2006. [doi]
Abstract is missing.