Nandakumar P. Venugopal, Nihal Shastry, Shambhu J. Upadhyaya. Effect of Process Variation on the Performance of Phase Frequency Detector. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 525-534, IEEE Computer Society, 2006. [doi]
Abstract is missing.