On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages

Daniela De Venuto, Michael J. Ohletz. On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. J. Electronic Testing, 17(3-4):243-253, 2001. [doi]

Authors

Daniela De Venuto

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Michael J. Ohletz

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