Daniela De Venuto, Michael J. Ohletz. On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. J. Electronic Testing, 17(3-4):243-253, 2001. [doi]
@article{VenutoO01,
title = {On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages},
author = {Daniela De Venuto and Michael J. Ohletz},
year = {2001},
doi = {10.1023/A:1013377811693},
url = {http://dx.doi.org/10.1023/A:1013377811693},
tags = {testing},
researchr = {https://researchr.org/publication/VenutoO01},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {3-4},
pages = {243-253},
}