M. Verchiani, E. Bouyssou, G. Fiannaca, F. Cantin, C. Anceau, P. Ranson. Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction. Microelectronics Reliability, 48(8-9):1412-1416, 2008. [doi]
@article{VerchianiBFCAR08,
title = {Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction},
author = {M. Verchiani and E. Bouyssou and G. Fiannaca and F. Cantin and C. Anceau and P. Ranson},
year = {2008},
doi = {10.1016/j.microrel.2008.07.032},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.032},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/VerchianiBFCAR08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1412-1416},
}