A Formal Test Set for RNS Adders and an Efficient Low Power BIST Scheme - researchr publication

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Haridimos T. Vergos, Dimitris Nikolos, Maciej Bellos, Costas Efstathiou. A Formal Test Set for RNS Adders and an Efficient Low Power BIST Scheme. In 2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001. pages 242-247, IEEE, 2001.

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