Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations - researchr publication authors

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Herman J. Vermaak, Hans G. Kerkhoff. Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations. In 6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001. pages 35-41, IEEE Computer Society, 2001. [doi]

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