Herman J. Vermaak, Hans G. Kerkhoff. Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations. In 6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001. pages 35-41, IEEE Computer Society, 2001. [doi]
@inproceedings{VermaakK01,
title = {Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations},
author = {Herman J. Vermaak and Hans G. Kerkhoff},
year = {2001},
doi = {10.1109/ETW.2001.946658},
url = {https://doi.org/10.1109/ETW.2001.946658},
researchr = {https://researchr.org/publication/VermaakK01},
cites = {0},
citedby = {0},
pages = {35-41},
booktitle = {6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001},
publisher = {IEEE Computer Society},
isbn = {0-7695-1017-5},
}