Enhanced P1500 compliant wrapper suitable for delay fault testing of embedded cores

H. J. Vermaak, H. G. Kerkhoff. Enhanced P1500 compliant wrapper suitable for delay fault testing of embedded cores. In 8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003. pages 121-126, IEEE Computer Society, 2003. [doi]

Abstract

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