Carlos Viale, Pablo A. Petrashin, Luis E. Toledo, Walter J. Lancioni, Carlos Vázquez. Single event effects in an analog SOI transconductor: a case study. In 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.