Machine Learning-based model for Single Event Upset Current Prediction in 14nm FinFETs - researchr publication

researchr

You are not signed in
Sign in
Sign up

Vibhu, Sparsh Mittal, Vivek Kumar. Machine Learning-based model for Single Event Upset Current Prediction in 14nm FinFETs. In 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems, VLSID 2023, Hyderabad, India, January 8-12, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract is missing.

runs on WebDSL