Heinrich Theodor Vierhaus, René Kothe. Embedded Diagnostic Logic Test Exploiting Regularity. In Luca Fanucci, editor, 11th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2008, Parma, Italy, September 3-5, 2008. pages 873-879, IEEE, 2008. [doi]
Abstract is missing.