Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(5):1064-1075, 2018. [doi]
Abstract is missing.