DD and body bias conditions for testing bridge defects in the presence of process variations

Hector Villacorta, Jose Luis Garcia-Gervacio, Jaume Segura, VĂ­ctor H. Champac. DD and body bias conditions for testing bridge defects in the presence of process variations. Microelectronics Journal, 46(5):398-403, 2015. [doi]

Abstract

Abstract is missing.