K. Vishwakarma, K. Lee, Anastasiia Kruv, Adrian Vaisman Chasin, Michiel J. van Setten, C. Pashartis, Oguzhan O. Okudur, M. Gonzalez, Nouredine Rassoul, A. Belmonte, Bem Kaczer. Impact of Mechanical Stress on IGZO TFTs: Enhancing PBTI Degradation. In IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025. pages 1-6, IEEE, 2025. [doi]
Abstract is missing.