Ramamurthy Vishweshwara, Ramakrishnan Venkatraman, H. Udayakumar, N. V. Arvind. An Approach to Measure the Performance Impact of Dynamic Voltage Fluctuations Using Static Timing Analysis. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 519-524, IEEE, 2009. [doi]
Abstract is missing.