Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development

Stefan R. Vock, Omar Escalona, Colin Turner. Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development. J. Electronic Testing, 31(1):107-117, 2015. [doi]

Authors

Stefan R. Vock

This author has not been identified. Look up 'Stefan R. Vock' in Google

Omar Escalona

This author has not been identified. Look up 'Omar Escalona' in Google

Colin Turner

This author has not been identified. Look up 'Colin Turner' in Google