Stefan R. Vock, Omar Escalona, Colin Turner. Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development. J. Electronic Testing, 31(1):107-117, 2015. [doi]
@article{VockET15,
title = {Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development},
author = {Stefan R. Vock and Omar Escalona and Colin Turner},
year = {2015},
doi = {10.1007/s10836-014-5495-z},
url = {http://dx.doi.org/10.1007/s10836-014-5495-z},
researchr = {https://researchr.org/publication/VockET15},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {31},
number = {1},
pages = {107-117},
}