Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, V. Rovner, S. Tiwary. Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 508-517, IEEE, 2004. [doi]
Abstract is missing.