Machine Learning from Mistakes: Self-Improving Attention Classifier Using Error-Related Potentials - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Lisa-Marie Vortmann, Timo Urban, Felix Putze. Machine Learning from Mistakes: Self-Improving Attention Classifier Using Error-Related Potentials. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 4770-4777, IEEE, 2023. [doi]

This author has not been identified. Look up 'Lisa-Marie Vortmann' in GoogleThis author has not been identified. Look up 'Timo Urban' in GoogleThis author has not been identified. Look up 'Felix Putze' in Google

runs on WebDSL