Lisa-Marie Vortmann, Timo Urban, Felix Putze. Machine Learning from Mistakes: Self-Improving Attention Classifier Using Error-Related Potentials. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 4770-4777, IEEE, 2023. [doi]
@inproceedings{VortmannUP23,
title = {Machine Learning from Mistakes: Self-Improving Attention Classifier Using Error-Related Potentials},
author = {Lisa-Marie Vortmann and Timo Urban and Felix Putze},
year = {2023},
doi = {10.1109/SMC53992.2023.10393901},
url = {https://doi.org/10.1109/SMC53992.2023.10393901},
researchr = {https://researchr.org/publication/VortmannUP23},
cites = {0},
citedby = {0},
pages = {4770-4777},
booktitle = {IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3702-0},
}