Lisa-Marie Vortmann, Timo Urban, Felix Putze. Machine Learning from Mistakes: Self-Improving Attention Classifier Using Error-Related Potentials. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 4770-4777, IEEE, 2023. [doi]
Abstract is missing.