Ioannis Voyiatzis. Embedding test patterns into Low-Power BIST sequences. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 197-198, IEEE Computer Society, 2007. [doi]
@inproceedings{Voyiatzis07,
title = {Embedding test patterns into Low-Power BIST sequences},
author = {Ioannis Voyiatzis},
year = {2007},
doi = {10.1109/IOLTS.2007.29},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.29},
tags = {testing},
researchr = {https://researchr.org/publication/Voyiatzis07},
cites = {0},
citedby = {0},
pages = {197-198},
booktitle = {13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece},
publisher = {IEEE Computer Society},
}