Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis. Accumulator-Based Weighted Pattern Generation. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 215-220, IEEE Computer Society, 2005. [doi]
Abstract is missing.