An efficient built-in self test method for robust path delay fault testing

Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis. An efficient built-in self test method for robust path delay fault testing. J. Electronic Testing, 8(2):219-222, 1996. [doi]

Authors

Ioannis Voyiatzis

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Antonis M. Paschalis

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Dimitris Nikolos

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Constantin Halatsis

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