Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis. An efficient built-in self test method for robust path delay fault testing. J. Electronic Testing, 8(2):219-222, 1996. [doi]
@article{VoyiatzisPNH96,
title = {An efficient built-in self test method for robust path delay fault testing},
author = {Ioannis Voyiatzis and Antonis M. Paschalis and Dimitris Nikolos and Constantin Halatsis},
year = {1996},
doi = {10.1007/BF02341826},
url = {http://dx.doi.org/10.1007/BF02341826},
tags = {testing},
researchr = {https://researchr.org/publication/VoyiatzisPNH96},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {8},
number = {2},
pages = {219-222},
}