Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink. ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1069-1078, IEEE Computer Society, 2003. [doi]
Abstract is missing.