Advanced modeling of distortion effects in bipolar transistors using the Mextram model

Leo C. N. de Vreede, Henk C. de Graaff, Koen Mouthaan, Marinus de Kok, Joseph L. Tauritz, Roel G. F. Baets. Advanced modeling of distortion effects in bipolar transistors using the Mextram model. J. Solid-State Circuits, 31(1):114-121, 1996. [doi]

Abstract

Abstract is missing.