Dirk K. de Vries, Paul L. C. Simon. Calibration of Open Interconnect Yield Models. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 26-33, IEEE Computer Society, 2003. [doi]
Abstract is missing.