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Estimation of defocus and astigmatism in transmission electron microscopy

M. Vulovic, P. L. Brandt, R. B. G. Ravelli, A. J. Koster, Lucas J. van Vliet, Bernd Rieger. Estimation of defocus and astigmatism in transmission electron microscopy. In Proceedings of the 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Rotterdam, The Netherlands, 14-17 April, 2010. pages 1121-1124, IEEE, 2010. [doi]

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M. Vulovic

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P. L. Brandt

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R. B. G. Ravelli

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A. J. Koster

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Lucas J. van Vliet

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Bernd Rieger

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