M. Vulovic, P. L. Brandt, R. B. G. Ravelli, A. J. Koster, Lucas J. van Vliet, Bernd Rieger. Estimation of defocus and astigmatism in transmission electron microscopy. In Proceedings of the 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Rotterdam, The Netherlands, 14-17 April, 2010. pages 1121-1124, IEEE, 2010. [doi]
Abstract is missing.