Estimation of defocus and astigmatism in transmission electron microscopy

M. Vulovic, P. L. Brandt, R. B. G. Ravelli, A. J. Koster, Lucas J. van Vliet, Bernd Rieger. Estimation of defocus and astigmatism in transmission electron microscopy. In Proceedings of the 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Rotterdam, The Netherlands, 14-17 April, 2010. pages 1121-1124, IEEE, 2010. [doi]

@inproceedings{VulovicBRKVR10,
  title = {Estimation of defocus and astigmatism in transmission electron microscopy},
  author = {M. Vulovic and P. L. Brandt and R. B. G. Ravelli and A. J. Koster and Lucas J. van Vliet and Bernd Rieger},
  year = {2010},
  doi = {10.1109/ISBI.2010.5490190},
  url = {http://dx.doi.org/10.1109/ISBI.2010.5490190},
  researchr = {https://researchr.org/publication/VulovicBRKVR10},
  cites = {0},
  citedby = {0},
  pages = {1121-1124},
  booktitle = {Proceedings of the 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Rotterdam, The Netherlands, 14-17 April, 2010},
  publisher = {IEEE},
  isbn = {978-1-4244-4125-9},
}