Israel A. Wagner, Israel Koren. An Interactive Yield Estimator as a VLSI CAD Tool. In Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli, editors, The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. pages 167-174, IEEE Computer Society, 1993.
@inproceedings{WagnerK93,
title = {An Interactive Yield Estimator as a VLSI CAD Tool},
author = {Israel A. Wagner and Israel Koren},
year = {1993},
researchr = {https://researchr.org/publication/WagnerK93},
cites = {0},
citedby = {0},
pages = {167-174},
booktitle = {The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings},
editor = {Fabrizio Lombardi and Mariagiovanna Sami and Yvon Savaria and Renato Stefanelli},
publisher = {IEEE Computer Society},
isbn = {0-8186-3502-9},
}