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An Interactive Yield Estimator as a VLSI CAD Tool

Israel A. Wagner, Israel Koren. An Interactive Yield Estimator as a VLSI CAD Tool. In Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli, editors, The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. pages 167-174, IEEE Computer Society, 1993.

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