Enhancing Board Functional Self-Test by Concurrent Sampling

Kenneth D. Wagner, Thomas W. Williams. Enhancing Board Functional Self-Test by Concurrent Sampling. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 633-640, IEEE Computer Society, 1991.

@inproceedings{WagnerW91:1,
  title = {Enhancing Board Functional Self-Test by Concurrent Sampling},
  author = {Kenneth D. Wagner and Thomas W. Williams},
  year = {1991},
  tags = {testing},
  researchr = {https://researchr.org/publication/WagnerW91%3A1},
  cites = {0},
  citedby = {0},
  pages = {633-640},
  booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-9156-5},
}