Wafer Pattern Recognition Using Tucker Decomposition

Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa. Wafer Pattern Recognition Using Tucker Decomposition. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]

Abstract

Abstract is missing.