Imran Wali, Marcello Traiola, Arnaud Virazel, Patrick Girard 0001, Mario Barbareschi, Alberto Bosio. Towards approximation during test of Integrated Circuits. In Manfred Dietrich, Ondrej Novák, editors, 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017. pages 28-33, IEEE, 2017. [doi]
@inproceedings{WaliTV0BB17,
title = {Towards approximation during test of Integrated Circuits},
author = {Imran Wali and Marcello Traiola and Arnaud Virazel and Patrick Girard 0001 and Mario Barbareschi and Alberto Bosio},
year = {2017},
doi = {10.1109/DDECS.2017.7934574},
url = {https://doi.org/10.1109/DDECS.2017.7934574},
researchr = {https://researchr.org/publication/WaliTV0BB17},
cites = {0},
citedby = {0},
pages = {28-33},
booktitle = {20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017},
editor = {Manfred Dietrich and Ondrej Novák},
publisher = {IEEE},
isbn = {978-1-5386-0472-4},
}