Challenges in Delay Testing of Integrated Circuits

D. M. H. Walker. Challenges in Delay Testing of Integrated Circuits. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 81-82, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.